P. Bokil, V. Suman, R. Venkatesh, P. Krishnan and T. Muske, "Effectiveness of Random Testing of Embedded Systems," 2012 45th Hawaii International Conference on System Sciences(HICSS), Maui, Hawaii USA, 2012, pp. 5556-5563.
doi:10.1109/HICSS.2012.233
keywords:{automatic test generation; test suite evaluation; embedded systems},
url:doi.ieeecomputersociety.org/10.1109/HICSS.2012.233