@INPROCEEDINGS{,
author = {Chao and Gray},
booktitle = {Design Automation Conference(DAC)},
title = {Micro-operation perturbations in chip level fault modeling},
year = {1988},
volume = {00},
number = {},
pages = {579-582},
keywords={logic testing; chip level fault modeling; micro-operation perturbation; stuck-at-fault coverage; combination circuits; gate level coverage},
doi = {10.1109/DAC.1988.14819},
url = {doi.ieeecomputersociety.org/10.1109/DAC.1988.14819},
ISSN = {},
month={06}
}