@INPROCEEDINGS{,
author = {P. Bokil and V. Suman and R. Venkatesh and P. Krishnan and T. Muske},
booktitle = {2012 45th Hawaii International Conference on System Sciences(HICSS)},
title = {Effectiveness of Random Testing of Embedded Systems},
year = {2012},
volume = {00},
number = {},
pages = {5556-5563},
keywords={automatic test generation; test suite evaluation; embedded systems},
doi = {10.1109/HICSS.2012.233},
url = {doi.ieeecomputersociety.org/10.1109/HICSS.2012.233},
ISSN = {},
month={01}
}