TY - CONF
TI - Micro-operation perturbations in chip level fault modeling
T2 - Design Automation Conference(DAC)
SP - 579
EP - 582
AU - Chao
AU - Gray
PY - 1988
KW - logic testing
KW - chip level fault modeling
KW - micro-operation perturbation
KW - stuck-at-fault coverage
KW - combination circuits
KW - gate level coverage
DO - 10.1109/DAC.1988.14819
JO - Design Automation Conference(DAC)
SN - 0-8186-0864-1
VO - 10.1109/DAC.1988.14819
VL - 00
JA - Design Automation Conference(DAC)
Y1 - June 1988
ER -