TY - CONF
TI - Effectiveness of Random Testing of Embedded Systems
T2 - 2012 45th Hawaii International Conference on System Sciences(HICSS)
SP - 5556
EP - 5563
AU - P. Bokil
AU - V. Suman
AU - R. Venkatesh
AU - P. Krishnan
AU - T. Muske
PY - 2012
KW - automatic test generation
KW - test suite evaluation
KW - embedded systems
DO - 10.1109/HICSS.2012.233
JO - 2012 45th Hawaii International Conference on System Sciences(HICSS)
SN - 978-0-7695-4525-7
VO - 10.1109/HICSS.2012.233
VL - 00
JA - 2012 45th Hawaii International Conference on System Sciences(HICSS)
Y1 - January 2012
ER -